Global Standards for the Microelectronics Industry
TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE
This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alph source.
Committee(s): JC-14, JC-14.1