Global Standards for the Microelectronics Industry
ROCS Workshop
Save the date for ROCS 2022: Monday, May 9th
On Monday, May 24, 2021 the 35th Annual ROCS (Reliability of Compound Semiconductors) Workshop was held online. ROCS was be co-located with the CS MANTECH Conference on its online, virtual conference platform, with the objective of bringing together researchers, manufacturers and users of compound semiconductor devices.
ROCS 2021 Agenda
Morning Session: 10:00-11:30 AM (Eastern) |
| Welcome Remarks Don Gajewski, Wolfspeed, A Cree Company |
| HiREV – AFRL Research Presented by: Brian Poling, AFRL |
| Effects of External Strain on GaN-Based HEMTs Under X-Ray Irradiation Presented by: Dan Fleetwood, Vanderbilt University |
|
Effects of Aging on Intermodulation Distortion of a COTS GaN HEMT |
| Status of “Guidelines for Space Qualification of GaN HEMT Technology” Presented by: John R. Scarpulla, Aerospace |
|
Afternoon Session: 1:30-3:00 PM (Eastern) |
| ROCS 35th Anniversary Presented by: Bill Roesch, formerly Qorvo |
|
Reliability of 150 nm, 28 V GaN HEMT Process up to Ka-band |
| Estimate of III-V FET Thermal Resistance from DC Electrical Measurements using Artificial Neural Networks Presented by: Masaya Iwamoto, Keysight |
|
Costly Component Out Of Pocket Defect Condition During RF Semiconductor IC Transport/Handling |
Presenters and topics subject to change without notice.
