Global Standards for the Microelectronics Industry
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Displaying 1 - 2 of 2 documents.
| Title | Document # |
Date |
|---|---|---|
RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS: |
JEB19 | Jan 1972 |
This recommendation applies to MOS Shift Registers. Definitions are given for P-channel registers but are applicable to all CMOS and N-channel with changes in power supply notation. Committee(s): JC-40 |
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TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS: |
JEB15 | Jan 1969 |
This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits. Committee(s): JC-40 |
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