Automotive Electronics Forum: Program

Thursday, September 28, 2017 • Stuttgart, Germany

8:30-9:30AM

Registered Attendee Check-In and Coffee/Tea Break

  Program Moderator

Charles Furnweger, JEDEC

9:25AM

Welcome Remarks
Mian Quddus, Chairman, JEDEC Board of Directors

Morning Keynotes

9:30-10:00AM

Automotive Electronics Market Trends
This market overview will focus on the advanced silicon technologies that are paving the way for automated driving.
Keynote Presenter: Akhilesh Kona, HIS Markit

10:00-10:30am

Autonomous Driving: Completely Reshaping Stereotypes of "Automotive Memory"
The automotive industry’s adoption of ICT for autonomous driving is a groundbreaking trend that illustrates the trend towards convergence and a breakdown of conventional barriers between two distinctive industries. In the traditional automotive industry, memory is just a small part among thousands of vehicle components, and leveraging legacy technology has been sufficient since longevity is the most significant concern. On the contrary, in the heart of the ICT industry, memory has been taking significant role in handling the massive amount data which is essential for an innovative user experience and device intelligence.

In-car memory performance requirements already exceed those for PC and mobile. In the upcoming autonomous era, the existing concept of "Automotive Memory" is no longer valid and at the same time conventional ICT memory is not evolving rapidly enough to fulfill industry requirements for autonomous driving technology. Under these circumstances, this is the right moment for technology leaders from both industries to work together to bridge this gap, and JEDEC is well-positioned to take a key role in managing this process and to help mitigate conflicts. This presentation will cover the technology aspect of autonomous memory and how cross-industrial collaborations can help make autonomous driving a reality.
Keynote Presenters: MJ Cho and Richard Walsh, Samsung

10:30-11:00AM

Requirements for Memory in Automotive Applications
The presentation gives inside into the requirements for automotive applications. The car environment with its special needs for lifetime, write cycles, data retention, diagnosis and quality will be covered.
Keynote Presenter: Michael Huonker, Daimler

Morning Session

 
11:00-11:30AM

Memory and Storage Architecture Optimization for Next Generation Automotive Systems
This session will address automotive quality and performance requirements for both the short term SOP2021+, long term SOP2024+ and beyond, including a look at specific problems facing automotive systems today, future quality requirements and potential areas for improvement. The driving factors in the automotive system architecture will also be covered, including solutions and challenges.

Presenter: Krunoslav Orcic, Harman Industries

11:30AM-Noon

Storage Needs for the Autonomous Driving Computer

Similar to other Automotive functions that use storage, the autonomous driving computer requires DRAM and flash solutions to work over a wide temperature range and meet high reliability and safety standards. However, the magnitude of the capacity and speed needed for the autonomous driving computer push the designs into using state of the art storage solutions. These solutions have not traditionally taken automotive requirements into account, and in particular, some methods used in commercial applications can have unintended implications for autonomous driving computer designs. This presentation will delve into the combination of these diverse requirements and how JEDEC standardization can help make solutions a reality.
Presenter: Michael Truog, NVIDIA

Noon-1:00PM Luncheon

Afternoon Keynotes

1:00-1:30PM

The Role of Nonvolatile Memory Security in Automotive Systems

The automotive industry will undergo significant change in the coming years, driven by the efficiencies and safety promised by autonomous vehicles and the automotive industry clearly need to incorporate security into their designs. Industry best practices today use various technologies and techniques to address perceived security vulnerabilities in automotive systems, but these solutions often neglect to consider the security of nonvolatile code and data content within the system. This abstract will first provide some background about typical device security architectures, followed by a discussion on the role of undiscovered security holes, and finally will show how improved memory security can not only enhance existing security solutions, but also provide protections that may not be possible by any other means.
Keynote Presenter: Federico Tiziani, Micron

1:30-2:00PM DRAM Solutions Required for Autonomous Driving Performance

Today, the automotive industry has been installing a variety of sensors and processors to implement autonomous driving, which requires high-performance systems. Automotive DRAMs also strive to meet the needs of various industries for different platforms, including high performance, reliability and various densities. SK Hynix will review industry requirements and present various DRAM solutions to realize autonomous driving.
Keynote Presenter: Andrea Guerra, SK Hynix

Afternoon Sessions

 
2:00-2:30PM

The Path Towards Autonomous Vehicles
The complexity of the requirements for automotive applications is increasing at an astonishing pace. For example, we now need to cover fault tolerant and failsafe systems. The functional safety of systems, products and processes increases with every day and with every new development and we must maintain a grasp of the risks during every phase: from the first concept through development and from operation through shutdown. Traditionally automotive reliability was achieved by addressing hard errors, but with newer processing nodes the impact of soft errors may have to be two orders of magnitude higher. With the increased connectivity and complexity there are serious security challenges for the design of automotive hardware/software architectures due to attacks. With the immense processing power that is being unlocked with multi-processor systems we are now able to address complex issues such as a complete inspection of the vehicle’s environment. In this paper we will discuss the challenges of implementing a safe, secure, complex driver assistance system that paves the way towards autonomous driving.
Presenter: Martin Duncan, ST Microelectronics

2:30-3:00PM

Status of ISO 26262 2nd Edition, with Focus on ISO 26262-11 (Guidelines for Semiconductors)
The presentation describes the status of ISO 26262 2nd edition, the functional safety standard for automotive. It summarizes the key requirements from item to element level. It covers in detail the contents of ISO 26262-11, the guideline on application of ISO 26262 to semiconductors, with specific focus on the base failure rate clause (with examples).
Presenter: Riccardo Mariani, Intel

3:00-3:30PM

JEDEC Quality and Reliability Standards and their Use in the Automotive and International Space

JEDEC's JC-14 Committee on Quality and Reliability has been developing Quality and Reliability Standards for decades, focusing on areas of technology such as Reliability Test methods (JC-14.1), Wafer Level Quality and Reliability (JC-14.2), Qualification and Reliability monitoring (JC-14.3), Quality and Systems (JC-14.4) and Semiconductor compounds (JC-14.7).  This presentation will cover the most important documents from each area and how they are used in the automotive environment, as well as offering a peek into the future for automotive Q&R.
Presenter: Nick Lycoudes, NXP

3:30-4:00PM

Advances in Wide Bandgap Semiconductor Technology and Industry Support of Standardization

At the 2015 JEDEC Automotive Forum auto manufacturers, Tier 1 suppliers, and others in the automotive industry expressed an urgent need for clear technical and applications information for Wide Bandgap power semiconductors. This included even definition of fundamental operating parameters, measurement procedures, and accurate simulation models. Since then, the major GaN and SiC suppliers have begun to work on standards that will address these issues and accelerate the already explosive growth in use of WBG power devices and modules. Simultaneously, rapid advances in reliability, performance, and understanding how to apply WBG technology is enabling the solution of what used to be considered impossible problems. This session will explain how JEDEC and the WBG industry heard and responded to the call to action, how WBG users can benefit from and get directly involved in the standardization activities, and describe the key advances in WBG technology that helped make this all possible.
Presenter: Perry Keller, Keysight

4:00-4:30PM Panel Discussion
4:30-5:30PM Reception

 Program, topics and speakers subject to change without notice.